Relation between oxygen vacancy and ferroelastic domain switching in tetragonal zirconia pseudo-single crystals

被引:6
作者
Kiguchi, T
Saiki, A
Shinozaki, K
Mizutani, N
机构
[1] Department of Inorganic Materials, Faculty of Engineering, Tokyo Institute of Technology, Meguro-ku, Tokyo 152, 2-12-1, O-okayama
关键词
ferroelastic domain switching; partially stabilized zirconia; switching amount; critical stress; oxygen ion; oxygen vacancy; domain wall; pinning;
D O I
10.2109/jcersj.104.1106
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Electrochemically reduced 3 mol% Y2O3-ZrO2 crystals were unidirectionally compressed in the range of 100 to 1000 MPa at temperatures from 550 to 800 degrees C to examine the effect of oxygen vacancy on ferroelastic domain switching. The switching amount of all the samples increased with increasing temperature. The switching amount of the cathode-side of reduced samples was less than that of the anode-side and as-grown samples compressed under the same stress. These results were interpreted using the model in which oxygen vacancy pins the domain wall. Domain switching occurred stepwise, and the critical stress was not influenced by the oxygen vacancy introduced by reduction.
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页码:1106 / 1111
页数:6
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