Electron-ion recombination of H- and He-like sulfur

被引：10

作者：

Ali, S. ^{[1
]}

Mahmood, S. ^{[1
]}

Orban, I. ^{[1
]}

Tashenov, S. ^{[1
]}

Li, Y. M. ^{[2
]}

Wu, Z. ^{[2
]}

Schuch, R. ^{[1
]}

机构：

[1] Stockholm Univ, Dept Phys, S-10691 Stockholm, Sweden

[2] Inst Appl Phys & Computat Math, Beijing 100088, Peoples R China

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2011年 / 44卷 / 22期

基金：

瑞典研究理事会;

关键词：

DIELECTRONIC-RECOMBINATION; CROSS-SECTIONS; FE; EXCITATION; ELEMENTS;

D O I：

10.1088/0953-4075/44/22/225203

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Electron-ion recombination of sulfur ions with electrons in the energy range of 1.6-3 keV was studied at the Stockholm Refrigerated Electron Beam Ion Trap. We obtained the KLn dielectronic recombination (DR) cross sections up to n = 5 for H-like and He-like sulfur ions by observing the x-rays from the trapped ions. A fully relativistic distorted wave approximation method was used for calculating the DR cross sections, while the resonance energies were obtained with a multiconfiguration Dirac-Fock approach using the GRASP II code. The calculations agree with the experimental results within the experimental error bars. Additionally, the obtained total DR resonance strengths were used to check the behaviour of a scaling formula for low-Z, He-like iso-electronic sequence (Watanabe et al 2001 J. Phys. B: At. Mol. Opt. Phys. 34 5095).

引用

页数：5

共 39 条

[1] DIELECTRONIC RECOMBINATION ON AND ELECTRON-IMPACT EXCITATION OF HELIUM-LIKE ARGON [J].