X-ray photoelectron study of electrical double layer at graphene/phosphoric acid interface

被引：3

作者：

Sysoev, Vitalii, I ^{[1
,2
]}

Okotrub, Alexander, V ^{[1
,2
]}

Arkhipov, Vyacheslav E. ^{[1
]}

Smirnov, Dmitry A. ^{[3
]}

Bulusheva, Lyubov G. ^{[1
,2
]}

机构：

[1] SB RAS, Nikolaev Inst Inorgan Chem, 3 Acad Lavrentiev Ave, Novosibirsk 630090, Russia

[2] Novosibirsk State Univ, 2 Pirogova Str, Novosibirsk 630090, Russia

[3] Tech Univ Dresden, Inst Solid State & Mat Phys, D-01062 Dresden, Germany

来源：

APPLIED SURFACE SCIENCE | 2020年 / 515卷

基金：

俄罗斯基础研究基金会;

关键词：

Graphene; Fluorinated graphene; Phosphoric acid; Electrical double layer; X-ray photoelectron spectroscopy; BINDING-ENERGY; GRAPHENE; ADSORPTION; XPS; INTERCALATION; PHOTOEMISSION; SPECTROSCOPY; TEMPERATURE; PERFORMANCE; PLATINUM;

D O I：

10.1016/j.apsusc.2020.146007

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Here, we use in situ X-ray photoelectron spectroscopy (XPS) to investigate electrochemical processes at the graphene surface. As a model system, we design a sandwich-type electrochemical cell consisting of working graphene electrode separated from back by a fluorinated graphene (FG) film impregnated with a phosphoric acid electrolyte. Migration of the ions to the graphene electrode under applied potential causes a change of the observed concentration of carbon and phosphorus in the electrochemical cell as compared to the non-charged state. This fact allows revealing the process of electrical double layer formation at the graphene/FG-separator interface. The observed changes in the binding energies of elements composing electrolyte and graphene electrode are related with a shift of the Fermi level due to the charge transfer from the adsorbed ions.

引用

页数：7

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