Polarization effects in coherent optical frequency-domain reflectometry

被引：6

作者：

Mussi, G ^{[1
]}

Stamp, P ^{[1
]}

Gisin, N ^{[1
]}

Passy, R ^{[1
]}

vonderWeid, JP ^{[1
]}

机构：

[1] PONTIFICIA UNIV CATOLICA RIO DE JANEIRO,CTR TELECOMMUN STUDIES,BR-22453900 RIO JANEIRO,BRAZIL

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 1996年 / 8卷 / 11期

关键词：

D O I：

10.1109/68.541567

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Polarization effects in coherent optical frequency domain reflectometry were evaluated. The use of a polarization average procedure completely eliminated these effects, giving rise to a measurement accuracy of 0.27 dB for an arbitrary polarization vector of the detected signal, without making use of polarization diversity receivers, which are not suitable to this case.

引用

页码：1513 / 1515

页数：3

共 13 条

[1] EICKHOFF W, 1981, APPL PHYS LETT, V9, P693
[2] POLARIZATION-INDEPENDENT INTERFEROMETRIC OPTICAL-TIME-DOMAIN REFLECTOMETER
KOBAYASHI, M
HANAFUSA, H
TAKADA, K
NODA, J
[J]. JOURNAL OF LIGHTWAVE TECHNOLOGY, 1991, 9 (05) : 623 - 628
[3] INTERSPECIMEN COMPARISON OF REFRACTIVE INDEX OF FUSED SILICA
MALITSON, IH
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (10P1) : 1205 - &
[4] MEASUREMENT AND THEORY OF MODE HOPPING IN EXTERNAL CAVITY LASERS
MORK, J
SEMKOW, M
TROMBORG, B
[J]. ELECTRONICS LETTERS, 1990, 26 (09) : 609 - 610
[5] -152.5 dB sensitivity high dynamic-range optical frequency-domain reflectometry
Mussi, G
Gisin, N
Passy, R
vonderWeid, JP
[J]. ELECTRONICS LETTERS, 1996, 32 (10) : 926 - 927
[6] HIGH-SENSITIVITY-COHERENT OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY FOR CHARACTERIZATION OF FIBEROPTIC NETWORK COMPONENTS
PASSY, R
GISIN, N
VONDERWEID, JP
[J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 1995, 7 (06) : 667 - 669
[7] EXPERIMENTAL AND THEORETICAL INVESTIGATIONS OF COHERENT OFDR WITH SEMICONDUCTOR-LASER SOURCES
PASSY, R
GISIN, N
VONDERWEID, JP
GILGEN, HH
[J]. JOURNAL OF LIGHTWAVE TECHNOLOGY, 1994, 12 (09) : 1622 - 1630
[8] MEASUREMENT OF RAYLEIGH BACKSCATTERING AT 1.55 MU-M WITH 32 MU-M SPATIAL-RESOLUTION
SORIN, WV
BANEY, DM
[J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 1992, 4 (04) : 374 - 376
[9] SORIN WV, 1993, Patent No. 95202745
[10] HIGH-SENSITIVITY LOW COHERENCE REFLECTOMETER USING ERBIUM-DOPED SUPERFLUORESCENT FIBER SOURCE AND ERBIUM-DOPED POWER-AMPLIFIER
TAKADA, K
KITAGAWA, T
SHIMIZU, M
HORIGUCHI, M
[J]. ELECTRONICS LETTERS, 1993, 29 (04) : 365 - 367

← 1 2 →