T '- RuO(2)sheet;
Density functional theory;
Electronic and magnetic properties;
Neel temperature;
DISORDER LAYERING TRANSITIONS;
COMPENSATION TEMPERATURE;
GRAPHENE STRUCTURE;
D O I:
10.1016/j.cocom.2021.e00614
中图分类号:
O469 [凝聚态物理学];
学科分类号:
070205 ;
摘要:
A previous theoretical study predicted the stable distorted octahedral (T') phase of RuO2 sheet using first-principles calculations based on density functional theory (DFT). It is a non-magnetic semiconductor with a bandgap of 0.74 eV using hybrid functionals. However, the Ru atom is located in 4d transition metal in the periodic table, and it has half-filled d orbitals. To correct the self-interaction errors which can be seen in this kind of material (which has half-filled d orbitals) Coulomb interactions should be included by using Hubbard + U parameters in the calculations. So, in this study, it is found that the T'-RuO2 sheet prefers an antiferromagnetic ground state with a direct bandgap of 1.77 eV by using DFT + U. In addition, the antiferromagnetic state is switched when charging and discharging the T'-RuO2 sheet. The T'-RuO2 sheet exhibits a large magnetic anisotropy (MAE) of 2.42 meV per Ru atom with an in-plane easy axis (EA). The EA can be tuned into out-of-plane direction by charging the RuO2 sheet. Mean-field approximation based on the 2D classical Heisenberg model predicts a high Neel temperature (T-N) of the T'-RuO2 sheet up to 335 K. The findings expand the potential of the T'-RuO2 sheet for antiferromagnetic spintronic devices.
机构:
Xiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaXiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China
Chen, Zhenping
He, Junjie
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机构:
Xiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China
Charles Univ Prague, Fac Sci, Prague 12843 2, Czech RepublicXiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China
He, Junjie
Zhou, Pan
论文数: 0引用数: 0
h-index: 0
机构:
Xiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaXiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China
Zhou, Pan
Na, Jiao
论文数: 0引用数: 0
h-index: 0
机构:
Xiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaXiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China
Na, Jiao
Sun, L. Z.
论文数: 0引用数: 0
h-index: 0
机构:
Xiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaXiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China
机构:
Xiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaXiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China
Chen, Zhenping
He, Junjie
论文数: 0引用数: 0
h-index: 0
机构:
Xiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China
Charles Univ Prague, Fac Sci, Prague 12843 2, Czech RepublicXiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China
He, Junjie
Zhou, Pan
论文数: 0引用数: 0
h-index: 0
机构:
Xiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaXiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China
Zhou, Pan
Na, Jiao
论文数: 0引用数: 0
h-index: 0
机构:
Xiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaXiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China
Na, Jiao
Sun, L. Z.
论文数: 0引用数: 0
h-index: 0
机构:
Xiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R ChinaXiangtan Univ, Hunan Prov Key Lab Thin Film Mat & Devices, Sch Mat Sci & Engn, Xiangtan 411105, Peoples R China