Kα/Kβ ratios of fluorescence X-rays as an information source on the depth distribution of iron in a low Z matrix

被引:14
作者
Trojek, Tomas [1 ]
Cechak, Tomas [1 ]
Musilek, Ladislav [1 ]
机构
[1] Czech Tech Univ, Fac Nucl Sci & Phys Engn, Dept Dosimetry & Applicat Ionizing Radiat, CR-11519 Prague 1, Czech Republic
关键词
D O I
10.2116/analsci.24.851
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
This paper describes how the K-alpha/K-beta count rate ratio of the characteristic X-rays of a given element, can be applied to determine the depth at which a layer or a grain of that element is located. The theoretical background and a basic description of the K-alpha/K-beta technique are given in the introduction. The experimental part of the paper deals with measurements of thick standard pure iron, intermediately thick iron foils, and layers prepared with a powder of Prussian blue. All these specimens were analyzed alone, and they were also analyzed overlaid with a low Z matrix. The light matrix consisted of sheets of paper of known thickness. Paper was chosen, because we take into account the subsequent application of this technique to surveys of historical monuments. The relation between the K-alpha count rate, the K-alpha/K-beta count rate ratio, and the distribution of iron in the paper matrix are presented here.
引用
收藏
页码:851 / 854
页数:4
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