Self-assembly growth and structure study of BiFeO3-CoFe2O4 nanostructure film

被引：0
|
作者：
Song, Q. [1 ]
Zhang, X. Y. [2 ]
Ong, C. K. [1 ,2 ]
机构：
[1] Natl Univ Singapore, Dept Phys, Ctr Superconducting & Magnet Mat, 2 Sci Dr 3, Singapore 117542, Singapore
[2] Natl Univ Singapore, Temasek Labs, Singapore 119260, Singapore
来源：
INTERNATIONAL CONFERENCE ON MAGNETISM (ICM 2009) | 2010年 / 200卷
关键词：
D O I：
10.1088/1742-6596/200/7/072092
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Pulsed laser deposition method was used to prepare (0.67) BiFeO3- (0.33) CoFe2O4 nanostructure thin film. The XRD analysis shows that lower growth temperature will not obtain separation of BiFeO3 and CoFe2O4 phase. Post-annealing treatment will induce the phase separation. XRD data and SEM image both confirm these phase separation.
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页数：4
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