Readout QDC for CdTe x-ray imager using direct charge treatment

被引：0

作者：

Takagi, Katsuyuki ^{[1
,2
]}

Takagi, Toshiyuki ^{[2
]}

Terao, Tsuyoshi ^{[1
,2
]}

Koike, Akifumi ^{[1
,2
]}

Aoki, Toru ^{[1
]}

机构：

[1] Shizuoka Univ, Grad Sch Sci & Technol, 3-5-1 Johoku, Hamamatsu, Shizuoka, Japan

[2] ANSeeN Inc, 3-5-1 Johoku, Hamamatsu, Shizuoka, Japan

来源：

IMAGE SENSING TECHNOLOGIES: MATERIALS, DEVICES, SYSTEMS, AND APPLICATIONS V | 2018年 / 10656卷

关键词：

QDC; CdTe; X-ray imager; Readout; Direct charge treatment; TIME;

D O I：

10.1117/12.2316419

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

X-ray imaging is popular in medical imaging, non-destructive testing and security. Main techniques of X-ray imaging with semiconductor detectors are charge accumulation and photon counting, and the photon counting is expected to identify materials at the same time with taking X-ray photograph by using energy information of X-ray photons. We proposed a direct charge handling method to build a photon counting system with energy information for X-ray imaging. This method operates the charge from the X-ray detector and converts it to encoded digital bit pattern directly without dead time of the front-end circuit. We simulated and built a proposed system to prove operating principals.

引用

页数：6

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