Readout QDC for CdTe x-ray imager using direct charge treatment

被引:0
|
作者
Takagi, Katsuyuki [1 ,2 ]
Takagi, Toshiyuki [2 ]
Terao, Tsuyoshi [1 ,2 ]
Koike, Akifumi [1 ,2 ]
Aoki, Toru [1 ]
机构
[1] Shizuoka Univ, Grad Sch Sci & Technol, 3-5-1 Johoku, Hamamatsu, Shizuoka, Japan
[2] ANSeeN Inc, 3-5-1 Johoku, Hamamatsu, Shizuoka, Japan
来源
IMAGE SENSING TECHNOLOGIES: MATERIALS, DEVICES, SYSTEMS, AND APPLICATIONS V | 2018年 / 10656卷
关键词
QDC; CdTe; X-ray imager; Readout; Direct charge treatment; TIME;
D O I
10.1117/12.2316419
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
X-ray imaging is popular in medical imaging, non-destructive testing and security. Main techniques of X-ray imaging with semiconductor detectors are charge accumulation and photon counting, and the photon counting is expected to identify materials at the same time with taking X-ray photograph by using energy information of X-ray photons. We proposed a direct charge handling method to build a photon counting system with energy information for X-ray imaging. This method operates the charge from the X-ray detector and converts it to encoded digital bit pattern directly without dead time of the front-end circuit. We simulated and built a proposed system to prove operating principals.
引用
收藏
页数:6
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