Miniaturized Ku-Band Filters in LTCC Technology - Evanescent Mode vs. Standard Cavity Filters

被引：0

作者：

Schulte, Benedikt ^{[1
]}

Ziegler, Volker ^{[1
]}

Schoenlinner, Bernhard ^{[1
]}

Prechtel, Ulrich ^{[1
]}

Schumacher, Hermann ^{[2
]}

机构：

[1] EADS Deutschland GmbH, Innovat Works, Willy Messerschmitt Str, D-85521 Ottobrunn, Germany

[2] Univ Ulm, Inst Electron Devices & Circuits, D-89081 Ulm, Germany

来源：

40TH EUROPEAN MICROWAVE CONFERENCE | 2010年

关键词：

DESIGN;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An miniaturized Evanescent Mode Cavity (EMC) filter was designed in Low Temperature Co-fired Ceramics (LTCC) technology as a Substrate Integrated Waveguide (SIW) component. The filter response and the Q-factor were measured and their temperature dependency was analyzed. The EMC-filter has a center-frequency of 15 GHz, a bandwidth of 554 MHz and a minimal insertion loss of -1.84 dB. The unloaded Q factor is 248. Additionally a similar filter design with standard cavities was re-fabricated on the same LTCC run. Both filters were compared in terms of component size, Q-factor, temperature dependency of different parameters and the sensitivity to manufacturing tolerances.

引用

页码：5 / 8

页数：4

共 7 条

[1] DESIGN OF EVANESCENT MODE WAVEGUIDE BANDPASS FILTERS FOR A PRESCRIBED INSERTION LOSS CHARACTERISTIC [J].

CRAVEN, GF ;

MOK, CK .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1971, MT19 (03) :295-&

[2]

Gautier W., 2009, P EUR MICR C ROM IT

[3]

Gautier W., 2009, GEMIC 2009

[4] Reduced size capacitive defect EBG resonators [J].

Gong, X ;

Chappell, WJ ;

Katehi, LPB .

2002 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, 2002, :1091-1094

[5] Q-FACTOR MEASUREMENT WITH NETWORK ANALYZER [J].

KAJFEZ, D ;

HWAN, EJ .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1984, 32 (07) :666-670

[6]

Matthaei G. L., 1980, MICROWAVE FILTERS IM

[7] A unified approach to the design, measurement, and tuning of coupled-resonator filters [J].

Ness, JB .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1998, 46 (04) :343-351

← 1 →