Transient deformation analysis using a carrier method of pulsed electronic speckle-shearing pattern interferometry

被引：0

作者：

Davila, A ^{[1
]}

Kaufmann, GH ^{[1
]}

Perez-Lopez, C ^{[1
]}

机构：

[1] Ctr Invest Opt, Leon 37000, Gto, Mexico

来源：

APPLIED OPTICS AND OPTOELECTRONICS 1998 | 1998年

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The introduction of a pulsed laser in an electronic speckle shearing pattern interferometer enables the measurement of high speed transient deformations. This paper reports on a(computerized system which allows automatic data reduction by introducing carrier fringes through the translation of a divergent lens. The quantitative determination of the phase map due to deformation is carried out by means of the spatial synchronous detection method. Experimental results obtained for a metal plate transiently deformed by an electromagnetic hammer illustrates the advantages of the proposed system.

引用

页码：59 / 65

页数：7