Positron-annihilation-lifetime response and broadband dielectric relaxation spectroscopy:: Diethyl phthalate

We report the results of a combined phenomenological analysis of the data from positron-annihilation-lifetime spectroscopy (PALS) and the relaxation data from broadband dielectric spectroscopy (BDS) on diethyl phthalate (DEP). The ortho-positronium (o-Ps) lifetime, tau(3), as a function of temperature over a temperature range from 67 K up to 300 K is compared with the spectral features and the relaxation parameters of the BDS spectra decomposed into the primary alpha and the secondary beta processes in the temperature range from 140 K up to 380 K by using the Williams-Watts scheme. Phenomenological model-free analysis of the tau(3)-T plot provides the three characteristic PALS temperatures, where the two most pronounced ones at T-g(PALS)=185 K and T-b2=245 K=1.32T(g)(PALS) are related to the glass-liquid transition and the onset of a quasiplateau region, respectively. In the case of a weaker bend effect at T-b1=210 K=1.14T(g)(PALS), a number of new coincidences with changes in the dielectric beta process have been found. They concern the changes in width parameter of the distribution function for the beta relaxation time and the activation energy of the beta(eff) process, a crossover from the Arrhenius to the non-Arrhenius type of temperature dependence as well as with the onset of a short-time tail of the beta relaxation time distribution and finally, with changes in the relaxation strength of the alpha and beta(eff) processes. All these findings indicate a close connection of the o-Ps annihilation parameters and relaxation characteristics of BDS response for the DEP matrix.