Microstructure of YBCO thin films prepared by TFA-MOD method

被引：1

作者：

Nagino, I. ^{[1
]}

Matsumoto, K. ^{[1
]}

Adachi, H. ^{[2
]}

Miyata, S. ^{[3
]}

Yoshizumi, M. ^{[3
]}

Izumi, T. ^{[3
]}

Shiohara, Y. ^{[3
]}

机构：

[1] Kyushu Inst Technol, Dept Mat Sci & Engn, Tobata Ku, Kitakyushu, Fukuoka 8048550, Japan

[2] Kyoto Univ, Dept Mat Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan

[3] ISTEC, Superconduct Res Lab, Koto Ku, Tokyo 1350062, Japan

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2010年 / 470卷 / 20期

关键词：

YBCO; TFA-MOD; CeO2; EBSP; IBAD; Biaxial texture; DEPOSITION;

D O I：

10.1016/j.physc.2010.05.100

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The microstructure of the recently developed coated conductors was investigated by using electron back scatter diffraction pattern (EBSP). We prepared TFA (trifluoroacetates)-MOD (metal organic deposition) derived YBa2Cu3O7-delta (YBCO) films on CeO2/LaMnO3/IBAD-MgO/Gd2Zr2O7/Hastelloy C276 substrates of 1 cm-width. The EBSP observation showed that there was a difference of surface microstructure between the midsection and the end of TFA-MOD YBCO film layer in the direction of width. This is attributed not to the local difference of the biaxial texture of CeO2 top layer but to the local difference of growth condition during TFA-MOD process. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：1308 / 1312

页数：5

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