Nonlinear emission of microcavity polaritons in the low density regime

被引:159
作者
Senellart, P [1 ]
Bloch, J [1 ]
机构
[1] CNRS, Microstruct & Microelect Lab, F-92225 Bagneux, France
关键词
D O I
10.1103/PhysRevLett.82.1233
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We present polariton emission measurements as a function of the excitation power in a III-V semiconductor microcavity. In a large range of power the polariton emission exhibits a clear nonlinear behavior. Since its energy, in-plane dispersion, and radiation pattern remain unchanged, no polariton bleaching occurs. A model, including phonon assisted relaxation stimulated by the polariton final state population, accurately describes the experimental variations of the nonlinearity amplitude and threshold with the detuning. [S0031-9007(98)08222-2].
引用
收藏
页码:1233 / 1236
页数:4
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