Nonlinear emission of microcavity polaritons in the low density regime

被引：160

作者：

Senellart, P ^{[1
]}

Bloch, J ^{[1
]}

机构：

[1] CNRS, Microstruct & Microelect Lab, F-92225 Bagneux, France

来源：

PHYSICAL REVIEW LETTERS | 1999年 / 82卷 / 06期

关键词：

D O I：

10.1103/PhysRevLett.82.1233

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We present polariton emission measurements as a function of the excitation power in a III-V semiconductor microcavity. In a large range of power the polariton emission exhibits a clear nonlinear behavior. Since its energy, in-plane dispersion, and radiation pattern remain unchanged, no polariton bleaching occurs. A model, including phonon assisted relaxation stimulated by the polariton final state population, accurately describes the experimental variations of the nonlinearity amplitude and threshold with the detuning. [S0031-9007(98)08222-2].

引用

页码：1233 / 1236

页数：4

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