Thermal sensors based on Sb2Te3 and (Sb2Te3)70(Bi2Te3)30 thin films

Thin films of Sb2Te3 and (Sb2Te3)(70)(Bi2Te3)(30) alloy and have been deposited on precleaned glass substrate by thermal evaporation technique in a vacuum of 2 x 10(-6) Torr. The structural study was carried out by X-ray diffractometer, which shows that the films are polycrystalline in nature. The grain size, microstrain and dislocation density were determined. The Seebeck coefficient was determined as the ratio of the potential difference across the films to the temperature difference. The power factor for the (Sb2Te3)(70) (Bi2Te3)(30) and (Sb2Te3) is found to be 19.602 and 1.066 of the film of thickness 1,500 angstrom, respectively. The Van der-Pauw technique was used to measure the Hall coefficient at room temperature. The carrier concentration was calculated and the results were discussed.