Why Testing Digital Relays Are Becoming So Difficult! Part 1

被引:0
作者
Vandiver, B., III [1 ]
机构
[1] OMICRON Elect, Houston, TX 77054 USA
来源
2014 67TH ANNUAL CONFERENCE FOR PROTECTIVE RELAY ENGINEERS | 2014年
关键词
Protection system; Distance; testing; relay; characteristic;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
This paper identifies some of the developing issues in testing what has here to fore been well understood protection elements we commonly used in designing modern protection systems. The core issue is the complexity of the combined protection element scheme logic that enables these "understood" protection elements to function more securely and reliably - but also prevent us from using legacy testing techniques like "constant test current" or "step change /state sequencing" to verify the set characteristic. Additionally, it makes a comparison of the commonly used test methods (constant current / constant voltage) focusing on common distance elements of Mho's and Quad's and how these now fall short in properly generating what the relay expects of a power system fault simulation. It identifies why these methods fall short, under what conditions they can and should be used and which lesser known test method should now be used to properly test all aspects of these distance characteristics
引用
收藏
页码:581 / 587
页数:7
相关论文
共 3 条
[1]  
Apostolov A., 2010, IEEE T D C NEW ORL L
[2]  
Apostolov A., 2001, AUTOMATED TESTING CO
[3]  
Apostolov A., 2009, TX A M REL C COLL ST