Nearly constant loss in crystalline oxide-ion conductor Gd2Zr2O7

被引:6
作者
Diaz-Guillen, M. R. [1 ]
Frechero, M. A. [1 ]
Diaz-Guillen, J. A. [2 ]
Fuentes, A. F. [3 ]
Leon, C. [1 ]
机构
[1] Univ Complutense Madrid, Fac Fis, Dept Fis Aplicada 3, GFMC, E-28040 Madrid, Spain
[2] Inst Tecnol Saltillo, Div Estudios Posgrad & Invest, Saltillo 25280, Coahuila, Mexico
[3] CINVESTAV, Unidad Saltillo, Saltillo 25000, Coahuila, Mexico
关键词
Ionic conductivity; Dielectric loss; Dielectric relaxation; ELECTRICAL RELAXATION; DIELECTRIC LOSS; AC CONDUCTIVITY; GLASSES; DYNAMICS; BEHAVIOR; TEMPERATURE; DISPERSION; SYSTEMS; ORIGIN;
D O I
10.1007/s10832-014-9907-3
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We present a study of the nearly constant loss regime in the oxide-ion conductor Gd2Zr2O7 by using Impedance Spectroscopy measurements. At enough low temperature, between 173 and 253 K, the dielectric loss is found to be almost temperature and frequency independent within the whole experimental frequency range (10 Hz - 1 MHz). However, a symmetric and very broad relaxation peak is clearly resolved in the loss spectra. This peak shows a thermally activated peak frequency with activation energy E (tau) = 0.29 +/- 0.02 eV, and its origin is discussed in terms of previously proposed models for the nearly constant loss.
引用
收藏
页码:15 / 19
页数:5
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