Refined Sr2FeMoO6 interface realized with photoemission and magnetization analysis

被引：3

作者：

Angervo, I ^{[1
]}

Saloaro, M. ^{[1
]}

Granroth, S. ^{[2
]}

Huhtinen, H. ^{[1
]}

Paturi, P. ^{[1
]}

机构：

[1] Univ Turku, Dept Phys & Astron, Wihuri Phys Lab, FI-20014 Turku, Finland

[2] Univ Turku, Dept Phys & Astron, Mat Res Lab, FI-20014 Turku, Finland

来源：

APPLIED SURFACE SCIENCE | 2020年 / 507卷

关键词：

Sr2FeMoO6; Thin film; Ex situ; X-ray photoelectron spectroscopy; RAY PHOTOELECTRON-SPECTROSCOPY; PULSED-LASER DEPOSITION; LEVEL BINDING-ENERGIES; THIN-FILMS; XPS SPECTRA; SURFACE; SRTIO3; SR; SEGREGATION; TEMPERATURE;

D O I：

10.1016/j.apsusc.2019.144435

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We investigate the effects of ex situ post-annealing on a set of identically deposited Sr2FeMoO6 (SFMO) thin films. The annealing provides a significant enhancement to ferrimagnetic exchange, evidenced by almost 40 K increase in Curie temperature. The electronic nature of the film surface is our focus of interest. The detailed analysis on oxygen 1s, strontium 3d, molybdenum 3d spectrum along with changes in the carbon contamination show purification from additional phases and significant valence fluctuation. Successful ex situ treatment provides films with higher Curie temperature and diminished surface contamination. Annealing therefore provides a possible method of reobtaining a portion of the valuable bulk attributes at interfaces in e.g. spin valve structures.

引用

页数：7

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