Electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy

被引：38
|
作者：
Paillet, M [1 ]
Poncharal, P [1 ]
Zahab, A [1 ]
机构：
[1] Univ Montpellier 2, CNRS, UMR 5581, Dynam Phases Condensees Grp, F-34095 Montpellier, France
来源：
PHYSICAL REVIEW LETTERS | 2005年 / 94卷 / 18期
关键词：
D O I：
10.1103/PhysRevLett.94.186801
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We report an experimental study of static charge distribution in individual single-walled carbon nanotubes grown on a Si+115 nm SiO2 substrate. From these experiments, we conclude that charges are distributed uniformly along the nanotubes. We demonstrate that electrostatic force microscopy can accurately measure the amount of charges per unit length. We found that this amount is diameter dependent and in the range of 1 electron per nanometer for a 2.5 nm nanotube at a potential of -3.5 V.
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页数：4
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