Enhanced geometrical superresolved imaging with moving binary random mask

被引：17

作者：

Borkowski, Amikam ^{[2
]}

Zalevsky, Zeev ^{[1
]}

Marom, Emanuel ^{[2
]}

Javidi, Bahram ^{[3
]}

机构：

[1] Bar Ilan Univ, Sch Engn, IL-52900 Ramat Gan, Israel

[2] Tel Aviv Univ, Sch Engn, IL-69978 Tel Aviv, Israel

[3] Univ Connecticut, Dept Elect & Comp Engn, Storrs, CT 06269 USA

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2011年 / 28卷 / 04期

关键词：

HIGH-RESOLUTION IMAGE; SENSOR;

D O I：

10.1364/JOSAA.28.000566

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

In this paper, we address the geometrical resolution limitation of an imaging sensor caused by the size of its pixels yielding insufficient spatial sampling of the image. The spatial blurring that is caused due to inadequate sampling can be resolved by placing a two-dimensional binary random mask in an intermediate image plane and shifting it along one direction while keeping the sensor as well as all other optical components fixed. Out of the set of images that are captured, a high resolution image can be decoded. In addition, this approach allows improved robustness to spatial noise. (C) 2011 Optical Society of America

引用

页码：566 / 575

页数：10

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