Lifetime-extended MCP-PMT

被引:34
作者
Jinno, T. [1 ]
Mori, T. [1 ]
Ohshima, T. [1 ]
Arita, Y. [1 ]
Inami, K. [1 ]
Ihara, T. [2 ]
Nishizawa, H. [2 ]
Sasaki, T. [2 ]
机构
[1] Nagoya Univ, Dept Phys, Chikusa Ku, Nagoya, Aichi 4648602, Japan
[2] Hamamatsu Photon KK Electron Tube Div Manuf 1, Dept 43, Shizuoka 4380193, Japan
基金
日本学术振兴会;
关键词
MCP-PMT; Photocathode; QE; Lifetime; TOP counter; MULTIANODE PMT; CROSS-TALK; COUNTER; PS;
D O I
10.1016/j.nima.2010.10.145
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In order to develop a long-lifetime MCP-PMT under high rates of circumstance, we investigated the degradation of the quantum efficiency (QE) of PMT's with a multialkali photocathode. We found that not only positive ions, but also neutral residual gases would damage the photocathode resulting in an enhancement of the work function: their countermeasures were established in newly manufactured square-shaped MCP-PMT's with 4 or 4 x 4 multi-anodes. The performances of the PMT's were measured: QE was stable up to an integrated amount of anode output charge of 2-3 C/cm(2), while keeping other basic performances steady, such as the time resolution for single photons (sigma(TTS)) of similar or equal to 40 ps, a photoelectron collection efficiency (CE) of 60%, a multiplication gain (G) of a few x 10(6), and dark counts of 20-300 Hz. The causes of QE degradation are discussed. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:111 / 117
页数:7
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