Effect of ambient on 4H-SiC bulk crystals grown by sublimation

被引:0
|
作者
Ciechonski, RR [1 ]
Yakimova, R [1 ]
Syväjärvi, M [1 ]
Janzén, E [1 ]
机构
[1] Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden
关键词
boron; bulk growth; cathodoluminescence; doping; tantalum;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Sublimation bulk growth in vacuum using graphite crucibles and such with tantalum shielding of the crucible walls has been studied. Residual nitrogen, aluminum and boron doping in the material grown in vacuum is presented. Activation energies of growth rate in respect to growth temperature in vacuum are deduced. The estimated values are 21 kcal/mole for growth temperatures below 2075degreesC and 128 kcal/mole in the range of growth temperatures between 2075degreesC and 2275degreesC. Cathodoluminescence spectra taken from samples grown in the graphite crucible in absence of tantalum under different pressures show nitrogen-aluminum DAP transition and strong luminescence from deep boron. This is not the case for samples grown in the tantalum environment.
引用
收藏
页码:75 / 78
页数:4
相关论文
共 50 条
  • [1] Defect characterization of 4H-SiC bulk crystals grown on micropipe filled seed crystals
    Kato, T
    Kojima, K
    Nishizawa, SI
    Arai, K
    SILICON CARBIDE AND RELATED MATERIALS 2004, 2005, 483 : 315 - 318
  • [2] Polytype stability and defect reduction in 4H-SiC crystals grown via sublimation technique
    Yakimova, R
    Iakimov, T
    Syväjärvi, M
    Jacobsson, H
    Råback, P
    Vehanen, A
    Janzén, E
    WIDE-BANDGAP SEMICONDUCTORS FOR HIGH-POWER, HIGH-FREQUENCY AND HIGH-TEMPERATURE APPLICATIONS-1999, 1999, 572 : 265 - 270
  • [3] High Quality Graphene Grown by Sublimation on 4H-SiC (0001)
    Lebedev, A. A.
    Davydov, V. Yu.
    Usachov, D. Yu.
    Lebedev, S. P.
    Smirnov, A. N.
    Eliseyev, I. A.
    Dunaevskiy, M. S.
    Gushchina, E. V.
    Bokai, K. A.
    Pezoldt, J.
    SEMICONDUCTORS, 2018, 52 (14) : 1882 - 1885
  • [4] High Quality Graphene Grown by Sublimation on 4H-SiC (0001)
    A. A. Lebedev
    V. Yu. Davydov
    D. Yu. Usachov
    S. P. Lebedev
    A. N. Smirnov
    I. A. Eliseyev
    M. S. Dunaevskiy
    E. V. Gushchina
    K. A. Bokai
    J. Pezoldt
    Semiconductors, 2018, 52 : 1882 - 1885
  • [5] Deep levels in 4H-SiC layers grown by sublimation epitaxy
    Syväjärvi, M
    Yakimova, R
    Ciechonski, RR
    Kakanakova-Georgieva, A
    Storasta, L
    Janzén, E
    OPTICAL MATERIALS, 2003, 23 (1-2) : 61 - 64
  • [6] Defects in sublimation-grown SiC bulk crystals
    Madar, R
    Pernot, E
    Anikin, M
    Pons, M
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2002, 14 (48) : 13009 - 13018
  • [7] Morphological features of sublimation-grown 4H-SiC layers
    Schulz, D
    Doerschel, J
    SILICON CARBIDE AND RELATED MATERIALS - 2002, 2002, 433-4 : 95 - 98
  • [8] Defect reduction in sublimation grown SiC bulk crystals
    Schmitt, Erwin
    Straubinger, Thomas
    Rasp, Michael
    Weber, Arnd-Dietrich
    SUPERLATTICES AND MICROSTRUCTURES, 2006, 40 (4-6) : 320 - 327
  • [9] Seeded sublimation growth of 6H and 4H-SiC crystals
    Yakimova, R
    Syväjärvi, M
    Tuominen, M
    Iakimov, T
    Råback, P
    Vehanen, A
    Janzén, E
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 61-2 : 54 - 57
  • [10] Carrier lifetime investigation in 4H-SiC grown by CVD and sublimation epitaxy
    Grivickas, P
    Galeckas, A
    Linnros, J
    Syväjärvi, M
    Yakimova, R
    Grivickas, V
    Tellefsen, JA
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2001, 4 (1-3) : 191 - 194