diamond films;
ultraviolet emission;
pn junction;
chemical vapor deposition (CVD);
D O I:
10.1016/S0925-9635(03)00111-0
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
The ultraviolet emission from a pn junction of heteroepitaxial diamond film was investigated. Diamond films were deposited on Si(100) by microwave plasma chemical vapor deposition. B-doped and P-doped layers were formed by trimethylboron and phosphine as impurity source gasses. The properties of p- and n-type layers were characterized by SEM, SIMS, Raman spectroscopy and Hall measurements. The experimental results showed that the current-voltage (I-V) characteristics of the pn junction exhibited good rectifying properties. A sharp emission peak at 235 nm was observed at 22 V for 9 mA at room temperature. Broad A-band emission in the visible region also appeared simultaneously. The results obtained are discussed in detail. (C) 2003 Elsevier Science B.V. All rights reserved.