Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

被引：1
作者：
Wang, P. [1 ]
Behan, G. [1 ]
Kirkland, A. I. [1 ]
Nellist, P. D. [1 ]
机构：
[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
基金：
英国工程与自然科学研究理事会;
关键词：
SCATTERING;
D O I：
10.1017/S1431927609094069
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：42 / 43
页数：2
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