Thermal parameter estimation in the presence of uncertainty

被引:0
作者
Emery, AF [1 ]
机构
[1] Univ Washington, Seattle, WA 98195 USA
来源
FIFTEENTH ANNUAL IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM | 1999年
关键词
D O I
10.1109/STHERM.1999.762425
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thermal properties are inferred from experiments by inverse techniques. In contrast to most mechanical and electrical experiments, thermal experiments usually involve boundary conditions and properties that have a degree of uncertainty. This uncertainty complicates the analysis and may lead to increased errors of estimation. This paper describes the application of an extended Maximum Likelihood principle to better quantify the amount of information yielded by the experiment and to reduce the effect of the uncertainty. The method is applied to an example of determining the contact resistance between a die and a substrate to demonstrate its use.
引用
收藏
页码:30 / 33
页数:4
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