On-Load Tap Changer Diagnosis-An Off-Line Method for Detecting Degradation and Defects: Part 2

被引：6

作者：

Erbrink, Jur J. ^{[1
]}

Gulski, Edward ^{[1
]}

Smit, Johan J. ^{[1
]}

Leich, Rory

Quak, Ben

Malewski, Ryszard A.

机构：

[1] Delft Univ Technol, NL-2600 AA Delft, Netherlands

来源：

IEEE ELECTRICAL INSULATION MAGAZINE | 2011年 / 27卷 / 06期

关键词：

contact resistance; contact; dynamic response; power transformer; resistance measurement; CONTACT RESISTANCE;

D O I：

10.1109/MEI.2011.6059982

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：27 / 36

页数：10

共 14 条

[1]

[Anonymous], 2003, A218 CIGRE WG

[2] EFFECTS ON CONTACT RESISTANCE OF PASSING ELECTRICAL-CURRENT THROUGH WIPING PALLADIUM CONTACTS [J].

CHEN, ZK ;

KARASAWA, K ;

SAWA, K .

IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A, 1995, 18 (03) :693-700

[3]

Erbrink J J, 2010, IEEE INT S EL INS SA

[4]

ERBRINK JJ, 2010, INT C COND MON DIAGN

[5]

ERBRINK JJ, 2010, INT C HIGH VOLT ENG

[6] On-Load Tap Changer Diagnosis - An Off-Line Method for Detecting Degradation and Defects: Part 1 [J].

Erbrink, Jur J. ;

Gulski, Edward ;

Smit, Johan J. ;

Seitz, Paul P. ;

Quak, Ben ;

Leich, Rory ;

Malewski, Ryszard A. .

IEEE ELECTRICAL INSULATION MAGAZINE, 2010, 26 (05) :49-59

[7]

GULSKI E, 2002, CIGRE C P, P25

[8]

*IEEE, C5712901987 IEEE

[9]

Kramer A., 2000, ON LOAD TAP CHANGERS

[10] A complete strategy for conducting dynamic contact resistance measurements on HV circuit breakers [J].

Landry, Michel ;

Turcotte, Olivier ;

Brikci, Fouad .

IEEE TRANSACTIONS ON POWER DELIVERY, 2008, 23 (02) :710-716

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