On-Load Tap Changer Diagnosis-An Off-Line Method for Detecting Degradation and Defects: Part 2

被引：6
作者：
Erbrink, Jur J. [1 ]
Gulski, Edward [1 ]
Smit, Johan J. [1 ]
Leich, Rory
Quak, Ben
Malewski, Ryszard A.
机构：
[1] Delft Univ Technol, NL-2600 AA Delft, Netherlands
来源：
IEEE ELECTRICAL INSULATION MAGAZINE | 2011年 / 27卷 / 06期
关键词：
contact resistance; contact; dynamic response; power transformer; resistance measurement; CONTACT RESISTANCE;
D O I：
10.1109/MEI.2011.6059982
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：27 / 36
页数：10
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