Quantitative structured-illumination phase microscopy

被引：18

作者：

Pavani, Sri Rama Prasanna ^{[1
]}

Libertun, Ariel R. ^{[1
]}

King, Sharon V. ^{[1
]}

Cogswell, Carol J. ^{[1
,2
]}

机构：

[1] Univ Colorado, Micro Opt Imaging Syst Lab, Dept Elect & Comp Engn, Boulder, CO 80309 USA

[2] CDM Opt Inc, Boulder, CO 80303 USA

来源：

APPLIED OPTICS | 2008年 / 47卷 / 01期

关键词：

D O I：

10.1364/AO.47.000015

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We introduce a quantitative phase imaging method for homogeneous objects with a bright field transmission microscope by using an amplitude mask and a digital processing algorithm. A known amplitude pattern is imaged on the sample plane containing a thick phase object by placing an amplitude mask in the field diaphragm of the microscope. The phase object distorts the amplitude pattern according to its optical path length (OPL) profile, and the distorted pattern is recorded in a CCD detector. A digital processing algorithm then estimates the object's quantitative OPL profile based on a closed form analytical solution, which is derived using a ray optics model for objects with small OPL gradients. (c) 2008 Optical Society of America.

引用

页码：15 / 24

页数：10

共 23 条

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