SiGe heteroepitaxy on Si (001) substrates induces three-dimensional Stranski-Krastanow growth. In this work, in-plane nanowires were produced during the growth of Si0.8Ge0.2 onto rib-patterned Si (001) templates oriented in [010] direction. Atomic force microscopy reveals initially hut-shaped SiGe islands on the upper (001) area of the ribs form extended nanowires with lengths of up to 10 mu m via coalescence and self-alignment to the rib direction. Finite element simulations show that these phenomena can be attributed to the minimization of the surface and strain energy density. This method provides a route towards devices based on in-plane SiGe nanowires. (C) 2011 American Institute of Physics. [doi:10.1063/1.3608149]
机构:
Univ Milano Bicocca, L NESS, I-20125 Milan, Italy
Univ Milano Bicocca, Dipartimento Sci Mat, I-20125 Milan, ItalyUniv Milano Bicocca, L NESS, I-20125 Milan, Italy