Self-aligned fabrication of in-plane SiGe nanowires on rib-patterned Si (001) substrates

被引:11
|
作者
Chen, G. [1 ]
Springholz, G. [1 ]
Jantsch, W. [1 ]
Schaeffler, F. [1 ]
机构
[1] Johannes Kepler Univ Linz, Inst Semicond & Solid State Phys, A-4040 Linz, Austria
关键词
SHAPE TRANSITION; QUANTUM DOTS; ISLANDS; SI(001); GROWTH; GE; PYRAMIDS; EPITAXY; DOMES;
D O I
10.1063/1.3608149
中图分类号
O59 [应用物理学];
学科分类号
摘要
SiGe heteroepitaxy on Si (001) substrates induces three-dimensional Stranski-Krastanow growth. In this work, in-plane nanowires were produced during the growth of Si0.8Ge0.2 onto rib-patterned Si (001) templates oriented in [010] direction. Atomic force microscopy reveals initially hut-shaped SiGe islands on the upper (001) area of the ribs form extended nanowires with lengths of up to 10 mu m via coalescence and self-alignment to the rib direction. Finite element simulations show that these phenomena can be attributed to the minimization of the surface and strain energy density. This method provides a route towards devices based on in-plane SiGe nanowires. (C) 2011 American Institute of Physics. [doi:10.1063/1.3608149]
引用
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页数:3
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