Raman Signature of Graphene Superlattices

被引：241

作者：

Carozo, Victor ^{[1
,3
]}

Almeida, Clara M. ^{[3
]}

Ferreira, Erlon H. M. ^{[3
]}

Cancado, Luiz Gustavo ^{[2
]}

Achete, Carlos Alberto ^{[1
,3
]}

Jorio, Ado ^{[2
]}

机构：

[1] Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil

[2] Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil

[3] Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, Brazil

来源：

NANO LETTERS | 2011年 / 11卷 / 11期

关键词：

Graphene; superlattice; Raman spectroscopy; double-resonance Raman; lattice resolution AFM; Moire pattern; SPECTROSCOPY; SCATTERING; GRAPHITE; DISORDER; DEFECTS;

D O I：

10.1021/nl201370m

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

When two identical two-dimensional periodic structures are superposed, a mismatch rotation angle between the structures generates a supetiattice. This effect is commonly observed in graphite, where the rotation between graphene layers generates Moire patterns in scanning tunneling microscopy images. Here, a study of intravalley and intervalley double-resonance Raman processes mediated by static potentials in rotationally stacked bilayer graphene is presented. The peak properties depend on the mismatch rotation angle and can be used as an optical signature for superlattices in bilayer graphene. An atomic force microscopy system is used to produce and identify specific rotationally stacked bilayer graphenes that demonstrate the validity of our model.

引用

页码：4527 / 4534

页数：8

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