Continuing evaluation of bipolar linear devices for total dose bias dependency and ELDRS effects

被引：10
作者：
McClure, SS [1 ]
Gorelick, JL [1 ]
Yui, CC [1 ]
Rax, BG [1 ]
Wiedeman, MD [1 ]
机构：
[1] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
来源：
2003 IEEE RADIATION EFFECTS DATA WORKSHOP RECORD | 2003年
关键词：
D O I：
10.1109/REDW.2003.1281310
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
We present results of continuing efforts to evaluate total dose bias dependency and ELDRS effects in bipolar linear microcircuits. Several devices were evaluated, each exhibiting moderate to significant bias and/or dose rate dependency.
引用
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页码：1 / 5
页数：5
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共 11 条
  • [1] RESPONSE OF ADVANCED BIPOLAR PROCESSES TO IONIZING-RADIATION
    ENLOW, EW
    PEASE, RL
    COMBS, W
    SCHRIMPF, RD
    NOWLIN, RN
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1991, 38 (06) : 1342 - 1351
  • [2] PHYSICAL-MECHANISMS CONTRIBUTING TO ENHANCED BIPOLAR GAIN DEGRADATION AT LOW-DOSE RATES
    FLEETWOOD, DM
    KOSIER, SL
    NOWLIN, RN
    SCHRIMPF, RD
    REBER, RA
    DELAUS, M
    WINOKUR, PS
    WEI, A
    COMBS, WE
    PEASE, RL
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1994, 41 (06) : 1871 - 1883
  • [3] Study of low-dose-rate radiation effects on commercial linear bipolar ICs
    Freitag, RK
    Brown, DB
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) : 2649 - 2658
  • [4] Modeling low-dose-rate effects in irradiated bipolar-base oxides
    Graves, RJ
    Cirba, CR
    Schrimpf, RD
    Milanowski, RJ
    Michez, A
    Fleetwood, DM
    Witczak, SC
    Saigne, F
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) : 2352 - 2360
  • [5] JohnsonTardieu JM, 1996, IMMUNOGENETICS, V43, P6
  • [6] TOTAL-DOSE EFFECTS IN CONVENTIONAL BIPOLAR-TRANSISTORS AND LINEAR INTEGRATED-CIRCUITS
    JOHNSTON, AH
    SWIFT, GM
    RAX, BG
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1994, 41 (06) : 2427 - 2436
  • [7] DEPENDENCE OF TOTAL-DOSE RESPONSE OF BIPOLAR LINEAR MICROCIRCUITS ON APPLIED DOSE-RATE
    MCCLURE, S
    PEASE, RL
    WILL, W
    PERRY, G
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1994, 41 (06) : 2544 - 2549
  • [8] Total dose performance of radiation hardened voltage regulators and references
    McClure, SS
    Gorelick, JL
    Pease, RL
    Rax, BG
    Ladbury, RL
    [J]. 2001 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2001, : 1 - 5
  • [9] Enhanced low-dose-rate sensitivity of a low-dropout voltage regulator
    Pease, RL
    McClure, S
    Gorelick, J
    Witczak, SC
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) : 2571 - 2576
  • [10] Common-source TLD and RADFET characterization of Co-60, Cs-137, and x-ray irradiation sources
    Simons, M
    Pease, RL
    Fleetwood, DM
    Schwank, JR
    Krzesniak, MF
    Turflinger, TL
    Buaron, J
    Riewe, LC
    Kemp, WT
    Duggan, PWC
    Johnston, AH
    Wiedeman, MC
    Mills, RE
    HolmesSiedle, AG
    Cohn, LM
    Doane, HJ
    Lohmeier, WL
    [J]. 1997 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 1997, : 28 - 34
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