Multiple diffraction in an icosahedral Al-Cu-Fe quasicrystal

被引:9
作者
Fan, C. Z. [1 ]
Weber, Th. [1 ]
Deloudi, S. [1 ]
Steurer, W. [1 ]
机构
[1] Swiss Fed Inst Technol, Dept Mat, Crystallog Lab, CH-8093 Zurich, Switzerland
关键词
quasicrystals; structure analysis; X-ray diffraction; X-RAY; REFLECTIONS;
D O I
10.1080/14786435.2010.512577
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In order to reveal its influence on quasicrystal structure analysis, multiple diffraction (MD) effects in an icosahedral Al-Cu-Fe quasicrystal have been investigated in-house on an Oxford Diffraction four-circle diffractometer equipped with an Onyx CCD area detector and MoK radiation. For that purpose, an automated approach for Renninger scans (-scans) has been developed. Two weak reflections were chosen as the main reflections (called P) in the present measurements. As is well known for periodic crystals, it is also observed for this quasicrystal that the intensity of the main reflection may significantly increase if the simultaneous (H) and the coupling (P-H) reflections are both strong, while there is no obvious MD effect if one of them is weak. The occurrence of MD events during -scans has been studied based on an ideal structure model and the kinematical MD theory. The reliability of the approach is revealed by the good agreement between simulation and experiment. It shows that the multiple diffraction effect is quite significant.
引用
收藏
页码:2528 / 2535
页数:8
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