共 7 条
- [1] NANOSTRUCTURE FABRICATION BY SCANNING TUNNELING MICROSCOPE [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1990, 29 (12): : 2854 - 2857
- [7] MODIFICATION OF SILICON SURFACE USING ATOMIC-FORCE MICROSCOPE WITH CONDUCTING PROBE [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1993, 32 (7B): : L1021 - L1023