Field-assisted adsorption of oxygen on rutile surfaces by an atomic force microscope

被引:0
作者
Kobayashi, K [1 ]
机构
[1] Shizuoka Univ, Fac Engn, Dept Mat Sci, Hamamatsu, Shizuoka 432, Japan
关键词
atomic force microscope; nanolithography; field-assisted adsorption of oxygen; TiO2;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using an atomic force microscope (AFM) with a conductive cantilever of Au coated Si, a negative voltage is applied to the TiO2 surface in air. Current flowing at an interface of TiO2 and Au is significantly decreased by repeating the application of a negative voltage to the TiO2 surface. In an AFM topograph and conductivity map, a strong attractive force and zero current appear on the specific area of the TiO2 surface which has been scanned at -5.0 V. These results suggest that chemisorption states, O2-, are formed at the TiO2 surface by scanning at -5.0 V.
引用
收藏
页码:249 / 253
页数:5
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