Novel near-infrared emission from crystal defects in MoS2 multilayer flakes

被引:70
作者
Fabbri, F. [1 ,2 ]
Rotunno, E. [1 ]
Cinquanta, E. [3 ]
Campi, D. [4 ]
Bonnini, E. [1 ]
Kaplan, D. [5 ]
Lazzarini, L. [1 ]
Bernasconi, M. [4 ]
Ferrari, C. [1 ]
Longo, M. [3 ]
Nicotra, G. [6 ]
Molle, A. [3 ]
Swaminathan, V. [5 ]
Salviati, G. [1 ]
机构
[1] IMEM CNR Inst, Parco Area Sci 37-A, I-43124 Parma, Italy
[2] Italian Space Agcy, KET Lab, Via Politecn, I-00133 Rome, Italy
[3] IMM CNR, Lab MDM, Via C Olivetti 2, I-20864 Agrate Brianza, Italy
[4] Univ Milano Bicocca, Dipartimento Sci Mat, Via R Cozzi 55, I-20126 Milan, Italy
[5] US Army RDECOM ARDEC, Fuze Precis Armaments & Technol Directorate, Picatinny Arsenal, NJ 07806 USA
[6] IMM CNR Inst, Str 8, I-95121 Catania, Italy
关键词
PHOTOLUMINESCENCE;
D O I
10.1038/ncomms13044
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The structural defects in two-dimensional transition metal dichalcogenides, including point defects, dislocations and grain boundaries, are scarcely considered regarding their potential to manipulate the electrical and optical properties of this class of materials, notwithstanding the significant advances already made. Indeed, impurities and vacancies may influence the exciton population, create disorder-induced localization, as well as modify the electrical behaviour of the material. Here we report on the experimental evidence, confirmed by ab initio calculations, that sulfur vacancies give rise to a novel near-infrared emission peak around 0.75 eV in exfoliated MoS2 flakes. In addition, we demonstrate an excess of sulfur vacancies at the flake's edges by means of cathodoluminescence mapping, aberration-corrected transmission electron microscopy imaging and electron energy loss analyses. Moreover, we show that ripplocations, extended line defects peculiar to this material, broaden and redshift the MoS2 indirect bandgap emission.
引用
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页数:7
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