Truncation error analysis of MTBF computation for multi-latch synchronizers

被引:2
作者
Mak, Terrence [1 ]
机构
[1] Newcastle Univ, Sch Elect Elect & Comp Engn, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England
关键词
Metastability; Mean time between failure (MTBF); Latch/flip-flop; Taylor series; Truncation error; METASTABILITY;
D O I
10.1016/j.mejo.2011.09.011
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Chip designs have an increasing number of independent clock domains. Synchronizer circuits are used to facilitate reliable data transfers between these clock domains. The task of these synchronizers is inherently prone to the occasional, statistically random, failure. These failures are frequently quantified by the synchronizers' mean time between failures, MTBF. The MTBF becomes worse at an exponential rate with increasing frequency. In contrast, the MTBF improves exponentially as more latches are cascaded to form the synchronizer, but at the cost of increasing the data transfer latency. Thus, selecting the number of latch stages to employ in the synchronizer is a trade-off between reliability and latency. We present equations for accurate estimation of the MTBF of multi-latch synchronizers, combined with an error analysis of these equations. We compare MTBF estimates obtained by using these equations to estimates gathered from comprehensive simulation analysis, and show that error terms are not insignificant. We provide a detailed description of all the assumptions that we have made in both the formulation of the MTBF equations and the circuit simulation environment. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:160 / 163
页数:4
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