P-InAsSbP/n-InAs single heterostructure back-side illuminated 8 x 8 photodiode array

被引:6
作者
Brunkov, P. N. [1 ]
Il'inskaya, N. D. [1 ]
Karandashev, S. A. [1 ]
Lavrov, A. A. [2 ]
Matveev, B. A. [1 ]
Remennyi, M. A. [1 ]
Stus, N. M. [1 ]
Usikova, A. A. [1 ]
机构
[1] Ioffe Inst, 26 Politekhnicheskaya, St Petersburg 194021, Russia
[2] IoffeLED Ltd, 26 Politekhnicheskaya, St Petersburg 194021, Russia
关键词
HOT mid-IR detectors; InAs photodiodes; Infrared sensors; Dark current; Backside illuminated photodiodes; Pyrometry; IR gas sensors; MU-M;
D O I
10.1016/j.infrared.2016.08.013
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
P-InAsSbP/n-InAs/n(+)-InAs single heterostructure photodiode monolithic array with linear impurity distribution in the space charge region and "bulk" n-InAs absorbing layer has been fabricated by the LPE method and studied for the first time. Unlike all known InAsSbP/InAs PDs with an abrupt p-n junction the linear impurity distribution PDs potentially suggest lower compared with analogs capacitance and tunneling current. Indeed the developed photodiodes showed good perspectives for use in low temperature pyrometry as low dark current (8 x 10(-6) A/cm(2), U-bias =-0.5 V, 164 K) and background limited infrared photodetector (BLIP) regime starting from 190 K (2 pi field of view, D*(3.1) (mu m) = 1.1 x 10(12) cm Hz(1/2)/W) have been demonstrated. High photodiode performance is thought to be due to above peculiarities of the impurity distribution as well as low defect density in P-InAsSbP/n-InAs/n(+)-InAs single heterostructure. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:249 / 253
页数:5
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