Rigorous electromagnetic analysis of resonant sub-wavelength metallic gratings by parametric Fourier modal method

被引：3
作者：
Granet, G [1 ]
机构：
[1] Univ Blaise Pascal, Lab Sci & Mat Elect & Automat, CNRS, UMR 6602, Aubiere, France
来源：
OPTICAL AND QUANTUM ELECTRONICS | 2001年 / 33卷 / 4-5期
关键词：
Fourier modal method; electromagnetic analysis; metallic gratings;
D O I：
10.1023/A:1010851103013
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Electromagnetic TM modes of metallic lamellar reflection or transmission gratings are analyzed by means of the parametric fourier modal method. We show that the resonant optical response of such devices is due to the excitation of guided waves inside the slits. Our rigorous methods allows us to define a resonance condition number and to calculate the field everywhere inside the grating layer.
引用
收藏
页码：471 / 483
页数：13
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