System for advanced signal analysis in measurements of surface's mechanical properties in atomic force microscopy

被引：0

作者：

Sikora, Andrzej ^{[1
]}

Bednarz, Lukasz ^{[2
]}

机构：

[1] Inst Elektrotech, Oddzial Technol & Mat Oznawstwa Elektrotech Wrocl, PL-50369 Wroclaw, Poland

[2] Wroclaw Univ Technol, Wydzial Elekt Mikrosyst & Fotoniki, PL-50372 Wroclaw, Poland

来源：

PRZEGLAD ELEKTROTECHNICZNY | 2010年 / 86卷 / 11A期

关键词：

atomic force microscopy; measurement techniques; signal processing; harmonic analysis;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, the development of diagnostic upgrade for commercial atomic force microscope is presented. By designing and implementing electronic and software solution, the torsional oscillations of the cantilever detection was possible. As the consequence, the force spectroscopy curve could be reconstructed allowing to perform fast, high-resolution mapping of mechanical properties of the sample such stiffness, adhesion or energy dissipation. (System for advanced signal analysis in measurements of surface's mechanical properties in atomic force microscopy).

引用

页码：207 / 210

页数：4

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