SWITCHING MAGNETIZATION MAGNETIC FORCE MICROSCOPY - AN ALTERNATIVE TO CONVENTIONAL LIFT-MODE MFM

被引：9
作者：
Cambel, Vladimir [1 ]
Gregusova, Dagmar
Elias, Peter [1 ]
Fedor, Jan [1 ]
Kostic, Ivan [2 ]
Manka, Jan [3 ]
Ballo, Peter [4 ]
机构：
[1] Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia
[2] Slovak Acad Sci, Inst Informat, Bratislava 84104, Slovakia
[3] Slovak Acad Sci, Inst Measurement Sci, Bratislava 84104, Slovakia
[4] Slovak Univ Technol Bratislava, Fac Elect Engn & Informat Technol, Bratislava 81219, Slovakia
来源：
JOURNAL OF ELECTRICAL ENGINEERING-ELEKTROTECHNICKY CASOPIS | 2011年 / 62卷 / 01期
关键词：
magnetic force microscopy; micromagnetic calculations; switching field; RESOLUTION; ELEMENTS; NANOSTRUCTURES; TIPS;
D O I：
10.2478/v10187-011-0006-2
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In the paper we present an overview of the latest progress in the conventional lift-mode magnetic force microscopy (MFM) technique, achieved by advanced MFM tips and by lowering the lift height. Although smaller lift height offers improved spatial resolution, we show that lowered tip-sample distance mixes magnetic, atomic and electric forces. We describe an alternative to the lift-mode procedure - Switching Magnetization Magnetic Force Microscopy [SM-MFM], which is based on two-pass scanning in tapping mode AFM with reversed tip magnetization between the scans. We propose design and calculate the magnetic properties of such SM-MFM tips. For best performance the tips must exhibit low magnetic moment, low switching field, and single-domain state at remanence. The switching field of such tips is calculated for Permalloy hexagons.
引用
收藏
页码：37 / 43
页数：7
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