Next-to-eikonal corrections to soft gluon radiation: a diagrammatic approach

被引:117
作者
Laenen, Eric [1 ,2 ,3 ]
Magnea, Lorenzo [4 ,5 ]
Stavenga, Gerben [6 ]
White, Chris D. [7 ,8 ]
机构
[1] Univ Amsterdam, ITFA, NL-1090 GL Amsterdam, Netherlands
[2] Univ Utrecht, ITF, NL-3584 CE Utrecht, Netherlands
[3] Nikhef, Amsterdam, Netherlands
[4] Univ Turin, Dipartimento Fis Teor, I-10125 Turin, Italy
[5] Ist Nazl Fis Nucl, Sez Torino, I-10125 Turin, Italy
[6] Fermilab Natl Accelerator Lab, Batavia, IL 60510 USA
[7] Univ Glasgow, Dept Phys & Astron, Glasgow G12 8QQ, Lanark, Scotland
[8] Univ Durham, Dept Phys, Inst Particle Phys Phenomenol, Durham DH1 3LE, England
来源
JOURNAL OF HIGH ENERGY PHYSICS | 2011年 / 01期
关键词
QCD Phenomenology; DRELL-YAN PROCESS; CROSS-SECTIONS; LARGE-X; FIELD-THEORY; RESUMMATION; EXPONENTIATION; ORDER; BREMSSTRAHLUNG; SCATTERING; COLLISIONS;
D O I
10.1007/JHEP01(2011)141
中图分类号
O412 [相对论、场论]; O572.2 [粒子物理学];
学科分类号
摘要
We consider the problem of soft gluon resummation for gauge theory amplitudes and cross sections, at next-to-eikonal order, using a Feynman diagram approach. At the amplitude level, we prove exponentiation for the set of factorizable contributions, and construct effective Feynman rules which can be used to compute next-to-eikonal emissions directly in the logarithm of the amplitude, finding agreement with earlier results obtained using path-integral methods. For cross sections, we also consider sub-eikonal corrections to the phase space for multiple soft-gluon emissions, which contribute to next-to-eikonal logarithms. To clarify the discussion, we examine a class of log(1- x) terms in the Drell-Yan cross-section up to two loops. Our results are the first steps towards a systematic generalization of threshold resummations to next-to-leading power in the threshold expansion.
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页数:67
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