Neutron-electron scattering length deduced from Pendellosung interferometry in neutron Bragg reflections on silicon

被引：5
|
作者：
Sparenberg, JM
Leeb, H
机构：
[1] Vienna Tech Univ, Atominst, A-1040 Vienna, Austria
[2] Free Univ Brussels, B-1050 Brussels, Belgium
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2003年 / 129卷 / 2-3期
关键词：
neutron charge radius; neutron-electron scattering length; neutron interferometry; silicon; temperature factor; Bragg reflection;
D O I：
10.1016/S0368-2048(03)00084-7
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
A new method to deduce the neutron-electron scattering length from high-precision thermal-neutron measurements of the nuclear scattering length and of the scattering amplitudes of Bragg reflections is proposed. It consists of an extension of a Pendellosung interferometric technique proposed by Shull in 1968 to higher-order Bragg reflections in silicon. Error-bar estimates show that it could solve the ambiguity between disagreeing experimental values of the neutron-electron scattering length and provide a very precise temperature factor of silicon. (C) 2003 Elsevier Science B.V. All rights reserved.
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页码：315 / 317
页数：3
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