Optical properties of graphene oxide and reduced graphene oxide determined by spectroscopic ellipsometry

被引:108
作者
Schoche, Stefan [1 ]
Hong, Nina [1 ]
Khorasaninejad, Mohammadreza [2 ]
Ambrosio, Antonio [2 ,3 ,4 ]
Orabona, Emanuele [3 ,4 ]
Maddalena, Pasqualino [3 ,4 ]
Capasso, Federico [2 ]
机构
[1] Woollam Co Inc, 645 M St,Suite 102, Lincoln, NE 68508 USA
[2] Harvard Univ, Sch Engn & Appl Sci, 29 Oxford St, Cambridge, MA 02138 USA
[3] Univ Napoli Federico II, CNR SPIN, Via Cintia, I-80126 Naples, Italy
[4] Univ Napoli Federico II, Dipartimento Fis, Via Cintia, I-80126 Naples, Italy
关键词
Graphene oxide; Reduced graphene oxide; Few-layer graphene; Spectroscopic ellipsometry; Optical constants; EXFOLIATED GRAPHITE OXIDE; INDUCED REDUCTION; FILMS;
D O I
10.1016/j.apsusc.2017.01.035
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We report the optical constants of graphene oxide and reduced graphene oxide determined by spectroscopic ellipsometry. The dynamic changes in optical properties and thickness of a drop-cast graphene oxide layer during reduction by long-term exposure to focused broad-band white light are monitored in situ. The anisotropic optical constants of the graphene oxide layer and the isotropically averaged optical constants of the reduced layer are precisely determined from a multiple-location analysis of spatially resolved data across the exposed location and a multiple-time-step analysis of the dynamic data, respectively. Observed inter-band transitions in the graphene oxide layer are discussed in relation to theoretical predictions for different coverage levels of the graphene oxide sheets with oxygen containing functional groups. The derived optical constants of the reduced graphene oxide layer are compared to reported values of graphene and thermally reduced graphene oxide. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:778 / 782
页数:5
相关论文
共 44 条
[1]  
Acik M., 2013, Journal of Materials Science Research, V2, P101
[2]   High resolution imaging of few-layer graphene [J].
Albrektsen, O. ;
Eriksen, R. L. ;
Novikov, S. M. ;
Schall, D. ;
Karl, M. ;
Bozhevolnyi, S. I. ;
Simonsen, A. C. .
JOURNAL OF APPLIED PHYSICS, 2012, 111 (06)
[5]   Visible to vacuum ultraviolet dielectric functions of epitaxial graphene on 3C and 4H SiC polytypes determined by spectroscopic ellipsometry [J].
Boosalis, A. ;
Hofmann, T. ;
Darakchieva, V. ;
Yakimova, R. ;
Schubert, M. .
APPLIED PHYSICS LETTERS, 2012, 101 (01)
[6]   Structural properties and dielectric function of graphene grown by high-temperature sublimation on 4H-SiC(000-1) [J].
Bouhafs, C. ;
Darakchieva, V. ;
Persson, I. L. ;
Tiberj, A. ;
Persson, P. O. A. ;
Paillet, M. ;
Zahab, A. -A. ;
Landois, P. ;
Juillaguet, S. ;
Schoeche, S. ;
Schubert, M. ;
Yakimova, R. .
JOURNAL OF APPLIED PHYSICS, 2015, 117 (08)
[7]   Modeling of graphite oxide [J].
Boukhvalov, D. W. ;
Katsnelson, M. I. .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2008, 130 (32) :10697-10701
[8]  
Brodie B.C., 1860, PHILOS T R SOC LONDO, V149, P249, DOI [10.1098/rspl.1859.0007, DOI 10.1098/RSTL.1859.0013]
[9]   A simple mechanical technique to obtain carbon nanoscrolls from graphite nanoplatelets [J].
Carotenuto, Gianfranco ;
Longo, Angela ;
De Nicola, Sergio ;
Camerlingo, Carlo ;
Nicolais, Luigi .
NANOSCALE RESEARCH LETTERS, 2013, 8 :1-6
[10]   Excitonic Fano Resonance in Free-Standing Graphene [J].
Chae, Dong-Hun ;
Utikal, Tobias ;
Weisenburger, Siegfried ;
Giessen, Harald ;
von Klitzing, Klaus ;
Lippitz, Markus ;
Smet, Jurgen .
NANO LETTERS, 2011, 11 (03) :1379-1382