A high-throughput thermoelectric power-factor screening tool for rapid construction of thermoelectric property diagrams

被引:50
作者
Otani, M. [1 ]
Lowhorn, N. D.
Schenck, P. K.
Wong-Ng, W.
Green, M. L.
Itaka, K.
Koinuma, H.
机构
[1] NIST, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USA
[2] Univ Tokyo, Grad Sch Frontier Sci, Kashiwa, Chiba 2778568, Japan
关键词
D O I
10.1063/1.2789289
中图分类号
O59 [应用物理学];
学科分类号
摘要
The authors have developed a high-throughput screening tool that maps out thermoelectric power factors of combinatorial composition-spread film libraries. The screening tool allows one to measure the electrical conductivity and Seebeck coefficient of over 1000 sample points within 6 h. Seebeck coefficients of standard films measured with the screening tool are in good agreement with those measured by traditional thermoelectric measurement apparatus. The rapid construction of thermoelectric property diagrams is illustrated for two systems: (Zn, Al)-O binary composition-spread film on Al2O3 (0001) and (Ca,Sr,La)(3)Co4O9 ternary composition-spread film on Si (100). (c) 2007 American Institute of Physics.
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页数:3
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