The importance of standardizing CDM ESD test head parameters to obtain data correlation

被引：7

作者：

Henry, LG ^{[1
]}

Kelly, MA ^{[1
]}

Diep, T ^{[1
]}

Barth, J ^{[1
]}

机构：

[1] ESD TLP Consulting, Fremont, CA 94538 USA

来源：

ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS, 2000 | 2000年

关键词：

D O I：

10.1109/EOSESD.2000.890030

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Parameters associated with an observed variation in Charged Device Model (CDM) ESD waveforms are shown to be pogo pin diameter, pogo pin length, distance between ground plane and charge plate, verification module disk diameter, dielectric area, and ground plane size. The effects on resulting discharge waveforms and solutions for improvement of existing CDM standards will be discussed.

引用

页码：72 / 84

页数：5