Performance-Aware Test Scheduling for Diagnosing Coexistent Channel Faults in Topology-Agnostic Networks-on-Chip

被引:10
作者
Bhowmik, Biswajit [1 ]
Deka, Jatindra Kumar [2 ]
Biswas, Santosh [3 ]
Bhattacharya, Bhargab B. [4 ]
机构
[1] Indian Inst Informat Technol Kurnool, Dept Comp Sci & Engn, Jagannathagattu Hill, Kurnool 518007, Andhra Pradesh, India
[2] Indian Inst Technol Guwahati, Dept Comp Sci & Engn, Gauhati 781039, Assam, India
[3] Indian Inst Technol Bhilai, Dept Elect Engn & Comp Sci, GEC Campus, Raipur 492015, Chhattisgarh, India
[4] Indian Stat Inst Kolkata, Adv Comp & Microelect Unit, 203 B T Rd, Kolkata 700108, W Bengal, India
关键词
Channels in NoC; testing stuck-at and short faults; PERMANENT FAULTS; SHORTS; NOC; INTERCONNECTS; ARCHITECTURE; PROCESSORS; SCHEME;
D O I
10.1145/3291532
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
High-performance multiprocessor SoCs used in practice require a complex network-on-chip (NoC) as communication architecture, and the channels therein often suffer from various manufacturing defects. Such physical defects cause a multitude of system-level failures and subsequent degradation of reliability, yield, and performance of the computing platform. Most of the existing test approaches consider mesh-based NoC channels only and do not perform well for other regular topologies such as octagons or spidergons, with regard to test time and overhead issues. This article proposes a topology-agnostic test mechanism that is capable of diagnosing on-line, coexistent channel-short, and stuck-at faults in these special NoCs as well as in traditional mesh architectures. We introduce a new test model called Daman, to decompose the network and present an efficient scheduling scheme to reduce test time without compromising resource utilization during testing. Additionally, the proposed scheduling scheme scales well with network size, channel width, and topological diversity. Simulation results show that the method achieves nearly 92% fault coverage and improves area overhead by almost 60% and test time by 98% compared to earlier approaches. As a sequel, packet latency and energy consumption are also improved by 67.05% and 54.69%, respectively, and they are further improved with increasing network size.
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页数:29
相关论文
共 52 条
[1]   Post-Silicon Platform for the Functional Diagnosis and Debug of Networks-on-Chip [J].
Abdel-Khalek, Rawan ;
Bertacco, Valeria .
ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS, 2014, 13
[2]  
Abdel-Khalek R, 2012, ICCAD-IEEE ACM INT, P557
[3]  
Abdelfattah MohamedS., 2015, FPGA, P98, DOI [DOI 10.1145/2684746.2689074, 10.1145/2684746.2689074]
[4]  
Abed S., 2017, P 6 INT C SOFTW COMP, P233
[5]   A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-Chip [J].
Aghaei, Babak ;
Khademzadeh, Ahmad ;
Reshadi, Midia ;
Badie, Kambiz .
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2017, 33 (04) :501-513
[6]  
Alshraiedeh J, 2016, 2016 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT), P127, DOI 10.1109/DFT.2016.7684083
[7]   Xpipes: A network-on-chip architecture for gigascale systems-on-chip [J].
Bertozzi, Davide ;
Benini, Luca .
IEEE Circuits and Systems Magazine, 2004, 4 (02) :18-31
[8]  
Bhowmik B., 2015, P IEEE 12 IND C INDI, P1
[9]   Reliability-Aware Test Methodology for Detecting Short-Channel Faults in On-Chip Networks [J].
Bhowmik, Biswajit ;
Biswas, Santosh ;
Deka, Jatindra Kumar ;
Bhattacharya, Bhargab B. .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018, 26 (06) :1026-1039
[10]  
Bhowmik B, 2017, DES AUT TEST EUROPE, P214, DOI 10.23919/DATE.2017.7926985