Epitaxial aluminum nitride tunnel barriers grown by nitridation with a plasma source

被引:25
|
作者
Zijlstra, T. [1 ]
Lodewijk, C. F. J. [1 ]
Vercruyssen, N. [1 ]
Tichelaar, F. D. [1 ]
Loudkov, D. N. [1 ]
Klapwijk, T. M. [1 ]
机构
[1] Delft Univ Technol, Fac Appl Phys, Kavli Inst Nanosci, NL-2628 CJ Delft, Netherlands
关键词
D O I
10.1063/1.2819532
中图分类号
O59 [应用物理学];
学科分类号
摘要
High critical current-density (10 to 420 kA/cm(2)) superconductor-insulator-superconductor tunnel junctions with aluminum nitride barriers have been realized using a remote nitrogen plasma from an inductively coupled plasma source operated in a pressure range of 10(-3)-10(-1) mbar. We find a much better reproducibility and control compared to previous work. From the current-voltage characteristics and cross-sectional transmission electron microscopy images it is inferred that, compared to the commonly used AlO(x) barriers, the polycrystalline AlN barriers are much more uniform in transmissivity, leading to a better quality at high critical current densities. (c) 2007 American Institute of Physics.
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页数:3
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