An efficient method for terminal reduction of interconnect circuits considering delay variations

被引:19
|
作者
Liu, P [1 ]
Tan, SXD [1 ]
Li, H [1 ]
Qi, ZY [1 ]
Kong, J [1 ]
McGaughy, B [1 ]
He, L [1 ]
机构
[1] Univ Calif Riverside, Dept Elect Engn, Riverside, CA 92521 USA
关键词
D O I
10.1109/ICCAD.2005.1560176
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper proposes a novel method to efficiently reduce the terminal number of general linear interconnect circuits with a large number of input and/or output terminals considering delay variations. Our new algorithm is motivated by the fact that VLSI interconnect circuits have many similar terminals in terms of their timing and delay metrics due to their closeness in structure or due to mathematic approximation using meshing in finite difference or finite element scheme during the extraction process. By allowing some delay tolerance or variations, we can reduce many similar terminals and keep a small number of representative terminals. After terminal reduction, traditional model order reduction methods can achieve more compact models and improve simulation efficiency. The new method, TERMMERG, is based on the moments of the circuits as the metrics for the timing or delay. It then employs singular value decomposition (SVD) method to determine the optimum number of clusters based on the low-rank approximation. After this the K-means clustering algorithm is used to cluster the moment of the terminals into different clusters. Experimental results on a number of real industry interconnect circuits demonstrate the effectiveness of the proposed method.
引用
收藏
页码:821 / 826
页数:6
相关论文
共 50 条
  • [21] Statistical Circuit Optimization Considering Device and Interconnect Process Variations
    Lin, I-Jye
    Ling, Tsui-Yee
    Chang, Yao-Wen
    PROCEEDINGS OF SLIP '07: 2007 INTERNATIONAL WORKSHOP ON SYSTEM LEVEL INTERCONNECT PREDICTION, 2007, : 47 - +
  • [22] Impact of interconnect parameter variations on wire-tree delay
    Bhavnagarwala, AJ
    Kapoor, A
    Meindl, JD
    2000 5TH INTERNATIONAL WORKSHOP ON STATISTICAL METROLOGY, 2000, : 80 - 83
  • [23] Monitoring Gate and Interconnect Delay Variations by Using Ring Oscillators
    Chen, Ying-Yen
    Lin, Chen-Tung
    Lee, Jin-Nung
    Wu, Chi-Feng
    2011 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), 2011, : 145 - 148
  • [24] An Efficient Method for Gathering Data Considering Energy and Delay Time on WSNs
    Phat Nguyen Huu
    Vinh Tran-Quang
    2014 IEEE FIFTH INTERNATIONAL CONFERENCE ON COMMUNICATIONS AND ELECTRONICS (ICCE), 2014, : 220 - 225
  • [25] Variations of interconnect capacitance and RC delay induced by process fluctuations
    Shigyo, N
    2000 5TH INTERNATIONAL WORKSHOP ON STATISTICAL METROLOGY, 2000, : 68 - 71
  • [26] Efficient gate delay modeling for large interconnect loads
    Kahng, AB
    Muddu, S
    1996 IEEE MULTI-CHIP MODULE CONFERENCE, PROCEEDINGS, 1996, : 202 - 207
  • [27] Compact models and delay computation of sub-threshold interconnect circuits
    Rohit Dhiman
    Rohit Sharma
    Rajeevan Chandel
    Analog Integrated Circuits and Signal Processing, 2015, 84 : 53 - 65
  • [28] An efficient reduction algorithm for computation of interconnect delay variability for statistical timing analysis in clock tree planning
    Sivakumar Bondada
    Soumyendu Raha
    Santanu Mahapatra
    Sadhana, 2010, 35 : 407 - 418
  • [29] An efficient reduction algorithm for computation of interconnect delay variability for statistical timing analysis in clock tree planning
    Bondada, Sivakumar
    Raha, Soumyendu
    Mahapatra, Santanu
    SADHANA-ACADEMY PROCEEDINGS IN ENGINEERING SCIENCES, 2010, 35 (04): : 407 - 418
  • [30] Compact models and delay computation of sub-threshold interconnect circuits
    Dhiman, Rohit
    Sharma, Rohit
    Chandel, Rajeevan
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2015, 84 (01) : 53 - 65