Mechanism on the nucleation of orientation-preferred Cu6Sn5 at different temperatures and solder compositions

被引:11
作者
Dong, Chong [2 ]
Shang, Min [2 ]
Ma, Haoran [1 ]
Wang, Yunpeng [2 ]
Li, Xiaogan [1 ]
Ma, Haitao [2 ]
机构
[1] Dalian Univ Technol, Sch Microelect, Dalian 116024, Peoples R China
[2] Dalian Univ Technol, Sch Mat Sci & Engn, Dalian 116024, Peoples R China
基金
美国国家科学基金会; 中国国家自然科学基金;
关键词
Diffusion; Cluster; Intermetallic; Crystal growth; LIQUID STRUCTURE TRANSITION; AG-CU SOLDER; GROWTH; SN; GRAINS; JOINT; PHASE; MORPHOLOGIES; AG3SN;
D O I
10.1016/j.jallcom.2021.163157
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this paper, the mechanism on the nucleation of orientation-preferred Cu6Sn5 at different temperatures and solder compositions was investigated. Results suggest that affected by temperature and solder composition, the distribution of clusters in solder plays an important role in the formation of preferred orientation. Higher temperature, Ag element and an appropriate amount of Cu element are favorable for the nucleation of orientation-preferred Cu6Sn5. However, the increase of Cu-Sn clusters size with the increase of Cu addition will lead to the nucleation of Cu6Sn5 in liquid solder, which does not need to follow the rule of the minimal lattice mismatch between Cu6Sn5 and Cu substrate. Meanwhile, the addition of Cu and Ag is conducive to the increase of grain size. Besides, the difference in solder volume between the central and edge region results in the difference in grain orientation. Furthermore, a model is established to illustrate that how the reflow temperature, Cu and Ag content affect the nucleation of orientation-preferred Cu6Sn5 through affecting the cluster evolution. The results have significant meaning in understanding and controlling the formation of Cu6Sn5 preferred orientation and improving the reliability of solder joints. (c) 2021 Elsevier B.V. All rights reserved.
引用
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页数:8
相关论文
共 36 条
[1]   A modified ''hole'' theory for solute impurity diffusion in liquid metals [J].
Cahoon, JR .
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1997, 28 (03) :583-593
[2]   Thermomigration in solder joints [J].
Chen, Chih ;
Hsiao, Hsiang-Yao ;
Chang, Yuan-Wei ;
Ouyang, Fanyi ;
Tu, K. N. .
MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2012, 73 (9-10) :85-100
[3]   Effect of the degree of supercooling on growth mechanism of Cu6Sn5 in pure Sn/Cu solder joint [J].
Guo, Bingfeng ;
Ma, Haitao ;
Kunwar, Anil ;
Chu, Xinhong .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2021, 32 (06) :7528-7540
[4]   Unidirectional Growth of Microbumps on (111)-Oriented and Nanotwinned Copper [J].
Hsiao, Hsiang-Yao ;
Liu, Chien-Min ;
Lin, Han-Wen ;
Liu, Tao-Chi ;
Lu, Chia-Ling ;
Huang, Yi-Sa ;
Chen, Chih ;
Tu, K. N. .
SCIENCE, 2012, 336 (6084) :1007-1010
[5]   Effects of Electromigration on Microstructural Evolution and Mechanical Properties of Preferential Growth Intermetallic Compound Interconnects for 3D Packaging [J].
Huang, M. L. ;
Zou, L. .
2019 IEEE 69TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2019, :1774-1781
[6]   Novel growth of whole preferred orientation intermetallic compound interconnects for 3D IC packaging [J].
Huang, M. L. ;
Zhang, Z. J. ;
Yang, F. ;
Zhao, N. .
2016 IEEE 66TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2016, :1216-1221
[7]   The influence of the crystallographic structure of the intermetallic grains on tin whisker growth [J].
Illes, Balazs ;
Skwarek, Agata ;
Ratajczak, Jacek ;
Dusek, Karel ;
Busek, David .
JOURNAL OF ALLOYS AND COMPOUNDS, 2019, 785 :774-780
[8]   The Effect of Crystallographic Orientation on the Mechanical Behavior of Cu6Sn5 by Micropillar Compression Testing [J].
Jiang, Ling ;
Jiang, Hanqing ;
Chawla, Nikhilesh .
JOURNAL OF ELECTRONIC MATERIALS, 2012, 41 (08) :2083-2088
[9]  
JOSHI ML, 1965, Z NATURFORSCH PT A, VA 20, P564
[10]   Copper-to-copper direct bonding on highly (111)-oriented nanotwinned copper in no-vacuum ambient [J].
Juang, Jing-Ye ;
Lu, Chia-Ling ;
Chen, Kuan-Ju ;
Chen, Chao-Chang A. ;
Hsu, Po-Ning ;
Chen, Chih ;
Tu, K. N. .
SCIENTIFIC REPORTS, 2018, 8