3D elemental sensitive imaging by full-field XFCT

被引：23

作者：

Deng, Biao ^{[1
]}

Du, Guohao ^{[1
]}

Zhou, Guangzhao ^{[1
]}

Wang, Yudan ^{[1
]}

Ren, Yuqi ^{[1
]}

Chen, Rongchang ^{[1
]}

Sun, Pengfei ^{[1
]}

Xie, Honglan ^{[1
]}

Xiao, Tiqiao ^{[1
]}

机构：

[1] Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201204, Peoples R China

来源：

ANALYST | 2015年 / 140卷 / 10期

基金：

中国国家自然科学基金;

关键词：

COMPUTED-TOMOGRAPHY XFCT; RAY; PINHOLE;

D O I：

10.1039/c4an02401j

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

X-ray fluorescence computed tomography (XFCT) is a stimulated emission tomography modality that maps the three-dimensional (3D) distribution of elements. Generally, XFCT is done by scanning a pencilbeam across the sample. This paper presents a feasibility study of full-field XFCT (FF-XFCT) for 3D elemental imaging. The FF-XFCT consists of a pinhole collimator and X-ray imaging detector with no energy resolution. A prototype imaging system was set up at the Shanghai Synchrotron Radiation Facility (SSRF) for imaging the phantom. The first FF-XFCT experimental results are presented. The cadmium (Cd) and iodine (I) distributions were reconstructed. The results demonstrate FF-XFCT is fit for 3D elemental imaging and the sensitivity of FF-XFCT is higher than a conventional CT system.

引用

页码：3521 / 3525

页数：5

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