Thermal analysis of flip-chip packaged 280 nm nitride-based deep ultraviolet light-emitting diodes

被引:65
作者
Shatalov, M [1 ]
Chitnis, A
Yadav, P
Hasan, MF
Khan, J
Adivarahan, V
Maruska, HP
Sun, WH
Khan, MA
机构
[1] Univ S Carolina, Dept Elect Engn, Columbia, SC 29208 USA
[2] Univ S Carolina, Dept Mech Engn, Columbia, SC 29208 USA
关键词
D O I
10.1063/1.1927695
中图分类号
O59 [应用物理学];
学科分类号
摘要
This letter reports on a low thermal impedance flip-chip packaged deep ultraviolet light-emitting diodes emitting at 280 nm featuring a finned heat sink. For a single 100 mu m x 100 mu m device flip-chip packaged onto an AlN submount and mounted on a TO-66 header with attached finned heat sink, a total junction to ambient thermal impedance as low as 33 degrees C/W was obtained. Numerical simulations of the heat transfer show that the excessive value of effective thermal impedance is mostly limited by insufficient junction area. (c) 2005 American Institute of Physics.
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页码:1 / 3
页数:3
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