High-resolution X-ray spectroscopy of rare events: a different look at local structure and chemistry

被引:39
作者
Bergmann, U [1 ]
Glatzel, P
Robblee, JH
Messinger, J
Fernandez, C
Cinco, R
Visser, H
McFarlane, K
Bellacchio, E
Pizarro, S
Sauer, K
Yachandra, VK
Klein, MP
Cox, BL
Nealson, KH
Cramer, SP
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Phys Biosci Div, Berkeley, CA 94720 USA
[2] Univ Calif Davis, Dept Appl Sci, Davis, CA 95616 USA
[3] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
关键词
X-ray fluorescence spectroscopy; X-ray Raman scattering; inelastic scattering; high resolution; metalloproteins;
D O I
10.1107/S0909049500016484
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The combination of large-acceptance high-resolution X-ray optics with bright synchrotron sources permits quantitative analysis of rare events such as X-ray fluorescence from very dilute systems, weak fluorescence transitions or X-ray Raman scattering. Transition-metal K beta fluorescence contains information about spin and oxidation state; examples of the characterization of the Mn oxidation states in the oxygen-evolving complex of photosystem II and Mn-consuming spores from the marine bacillus SG-1 are presented. Weaker features of the K beta spectrum resulting from valence-level and 'interatomic' ligand to metal transitions contain detailed information on the ligand-atom type, distance and orientation. Applications of this spectral region to characterize the local structure of model compounds are presented. X-ray Raman scattering (XRS) is an extremely rare event, but also represents a unique technique to obtain bulk-sensitive low-energy (<600 eV) X-ray absorption fine structure (XAFS) spectra using hard (<similar to> 10 keV) X-rays. A photon is inelastically scattered, losing part of its energy to promote an electron into an unoccupied level. In many cases, the cross section is proportional to that of the corresponding absorption process yielding the same X-ray absorption near-edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) features. XRS finds application for systems that defy XAFS analysis at low energies, e.g. liquids or highly concentrated complex systems, reactive compounds and samples under extreme conditions (pressure, temperature). Recent results are discussed.
引用
收藏
页码:199 / 203
页数:5
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